Lynnworth Technical Services

Waltham Massachusetts USA

Partial Bibliography

Preamble

Links are given below to some of Larry’s papers, to titles of his articles or chapters in eight books by others (1979-2007), to papers by colleagues, and to reviews of his book, Ultrasonic Measurements for Process Control.

Links are given to a few selected publications by others (e.g. NIST) on flow or other process control topics. Links to selected data are also included.

Papers authored or co-authored by Larry are generally listed chronologically within five subject areas. These areas are: G (General or Basic), H (Liquid Level), N (NDT or Materials Evaluation), T (Temperature), and V (Flow). You can search all of these listings using Control F to find the next occurrence of a key word like "temperature" within any listed article. Most articles are copyrighted by the publishing organization. Some links provide information for retrieving an article. Chapters are grouped under G. A few entries involve flow and liquid level and therefore appear in categories V and H.

For links to his most-recent patents, and to >500 patents by others (as of November 2009) in which one or more of his 50 US patents are cited, see patents.html. Larry's 33 most recent US patents, 1977-2009, are also listed at patentgenius.com.

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G General or Basic

Chapters in books edited by others
Articles

H Liquid Level

N NDT or Materials Evaluation

T Temperature

V Flow

Related technology

This section lists links to papers not by Larry, but authored or co-authored by one or more of Larry's present or former colleagues, or pre-acquisition customers of Panametrics, Inc. with whom Larry collaborated.

Editorial Reviews of Larry's Book

Selected Presentations

Selected Publications by Others

NASA Tech Brief articles & NASA New Technology Awards

This section lists four NASA Tech Brief articles on R&D work by Larry and colleagues, 1968, 1970, 1973 & 1993, and two corresponding NASA New Technology Awards, 1973 & 1993.

Vaaler Awards

Two ultrasonic products introduced by Panametrics, Inc. in the mid-1980s, partly based on US patents 4,735,097 (LCL) and 4,754,650 (JWS, LDB & LCL), received Vaaler Awards in 1984 and 1986. For general information on Vaaler biennial awards from Chemical Processing Magazine, see leica-geosystems.com.

Disclaimer: The material on these pages is provided for educational purposes and general information. Lynnworth Technical Services disclaims any liability for the content provided in the listed references or links. Readers are responsible for finding the latest and most accurate scientific and engineering data and information related to their application. Readers are responsible for determining technical and IP (intellectual property) applicability to their situation. This includes evaluation of technical limitations and IP restrictions. Lynnworth Technical Services disclaims liability in areas mentioned and in related areas.

Readers are also responsible for protecting their computers against malware. Lynnworth Technical Services is not aware of any malware in the linked documents, but in any case, disclaims liability for the use of linked pages as their content is subject to change without our control or consent.

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